Facility ID | Facility Name | Source Type | Analyte Group | Analyte Code | Analyte Name | Sample Date |
Result | Analyte Level Type |
Current Analyte Level |
Analyte Level Units |
Detection Limit |
Received Date |
Sample ID | Lab ID | Lab Name | Analysis Method | Method Name | SelectYear | SelectAnalyte | SelectResult | SelectFacilityID | SelectFacilityName | SelectSourceType | SelectLabID | SelectLabName | SelectMethod | SelectMethodName | FilterSampleDate |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AA | WELL - WELL | Raw | NO3 | 1040 | NITRATE | 5/12/1993 | 0.11 | MCL | 10 | MG/L | 0 | 3/1/1994 | 93-3801 | 28 | Neilson Research Corporation | 353.3 | CADMIUM REDUCTION, MANUAL | 1993 | NO3-1040 | D | AA | WELL - WELL | Raw | 28 | Neilson Research Corporation | 353.3 | CADMIUM REDUCTION, MANUAL | 1993-05-12 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 8/15/1995 | ND | MCL | 10 | MG/L | 0.2 | 8/21/1995 | 95-8172 | 28 | Neilson Research Corporation | 4500D | 1995 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500D | 1995-08-15 | ||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/25/1996 | ND | MCL | 10 | MG/L | 0.2 | 8/2/1996 | 96-6842 | 28 | Neilson Research Corporation | 4500NO3D | 1996 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500NO3D | 1996-07-25 | ||
AA | WELL - WELL | Raw | NO3 | 1040 | NITRATE | 5/17/1994 | ND | MCL | 10 | MG/L | 0.2 | 6/9/1994 | 94-4811 | 28 | Neilson Research Corporation | WEWWG/5880 | ION SELECTIVE ELECTRODE | 1994 | NO3-1040 | N | AA | WELL - WELL | Raw | 28 | Neilson Research Corporation | WEWWG/5880 | ION SELECTIVE ELECTRODE | 1994-05-17 |
AA | WELL - WELL | Raw | NO2 | 1041 | NITRITE | 5/12/1993 | ND | MCL | 1 | MG/L | 0.01 | 3/1/1994 | 93-3801 | 28 | Neilson Research Corporation | 354.1 | SPECTROPHOTOMETRIC, MANUAL | 1993 | NO2-1041 | N | AA | WELL - WELL | Raw | 28 | Neilson Research Corporation | 354.1 | SPECTROPHOTOMETRIC, MANUAL | 1993-05-12 |
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/25/1996 | 920 | 0 | 8/2/1996 | 96-6842 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1996 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1996-07-25 | |||
AA | WELL | Raw | WQ | 1925 | PH | 7/25/1996 | 7.52 | MCL | 8.5 | PH | 0 | 8/2/1996 | 96-6842 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1996 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1996-07-25 |