Facility ID | Facility Name | Source Type | Analyte Group | Analyte Code | Analyte Name | Sample Date |
Result | Analyte Level Type |
Current Analyte Level |
Analyte Level Units |
Detection Limit |
Received Date |
Sample ID | Lab ID | Lab Name | Analysis Method | Method Name | SelectYear | SelectAnalyte | SelectResult | SelectFacilityID | SelectFacilityName | SelectSourceType | SelectLabID | SelectLabName | SelectMethod | SelectMethodName | FilterSampleDate |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AA | WELL | Raw | IOC | 1045 | SELENIUM | 12/2/1996 | ND | MCL | 0.05 | MG/L | 0.002 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | IOC-1045 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 |
AA | WELL | Raw | ARS | 1005 | ARSENIC | 12/2/1996 | 0.004 | MCL | 0.010 | MG/L | 0 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | ARS-1005 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 |
AA | WELL | Raw | IOC | 1010 | BARIUM | 12/2/1996 | ND | MCL | 2 | MG/L | 0.1 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 3111B | ATOMIC ABSORPTION DIRECT ASPIRATION | 1996 | IOC-1010 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 3111B | ATOMIC ABSORPTION DIRECT ASPIRATION | 1996-12-02 |
AA | WELL | Raw | IOC | 1015 | CADMIUM | 12/2/1996 | ND | MCL | 0.005 | MG/L | 0.0001 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | IOC-1015 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 |
AA | WELL | Raw | IOC | 1017 | CHLORIDE | 12/2/1996 | 28 | MCL | 250 | MG/L | 0 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 400CI-B | 1996 | IOC-1017 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 400CI-B | 1996-12-02 | ||
AA | WELL | Raw | IOC | 1020 | CHROMIUM | 12/2/1996 | ND | MCL | 0.1 | MG/L | 0.001 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | IOC-1020 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 |
AA | WELL | Raw | IOC | 1024 | CYANIDE | 12/2/1996 | ND | MCL | 0.2 | MG/L | 0.02 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 4500CN/CE | 1996 | IOC-1024 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500CN/CE | 1996-12-02 | ||
AA | WELL | Raw | IOC | 1025 | FLUORIDE | 12/2/1996 | 0.41 | MCL | 4.0 | MG/L | 0 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 4500F-B,D | 1996 | IOC-1025 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500F-B,D | 1996-12-02 | ||
AA | WELL | Raw | LCR | 1030 | LEAD | 12/2/1996 | 0.005 | ACL | 0.015 | MG/L | 0 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | LCR-1030 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 |
AA | WELL | Raw | IOC | 1035 | MERCURY | 12/2/1996 | ND | MCL | 0.002 | MG/L | 0.0002 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 245.1 | MANUAL COLD VAPOR TECHNIQUE | 1996 | IOC-1035 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 245.1 | MANUAL COLD VAPOR TECHNIQUE | 1996-12-02 |
AA | WELL | Raw | IOC | 1036 | NICKEL | 12/2/1996 | ND | 0.001 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | IOC-1036 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 | |||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 8/2/2001 | ND | MCL | 10 | MG/L | 0.012 | 8/13/2001 | 010804501A | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2001 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2001-08-02 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 8/19/1999 | ND | MCL | 10 | MG/L | 0.2 | 8/30/1999 | 9908505 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999-08-19 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/28/1998 | ND | MCL | 10 | MG/L | 0.2 | 8/3/1998 | 98-8507 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998-07-28 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/21/2000 | ND | MCL | 10 | MG/L | 0.012 | 7/31/2000 | 000744501A | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2000 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2000-07-21 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 12/2/1996 | ND | MCL | 10 | MG/L | 0.01 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 4500NO3E | 1996 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500NO3E | 1996-12-02 | ||
AA | WELL | Raw | NO2 | 1041 | NITRITE | 12/2/1996 | ND | MCL | 1 | MG/L | 0.01 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 4500NO2B | 1996 | NO2-1041 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500NO2B | 1996-12-02 | ||
AA | WELL | Raw | IOC | 1052 | SODIUM | 12/2/1996 | 28 | ACL | 20 | MG/L | 0 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 273.1 | ATOMIC ABSORPTION DIRECT ASPIRATION | 1996 | IOC-1052 | E | AA | WELL | Raw | 28 | Neilson Research Corporation | 273.1 | ATOMIC ABSORPTION DIRECT ASPIRATION | 1996-12-02 |
AA | WELL | Raw | IOC | 1055 | SULFATE | 12/2/1996 | 26 | MCL | 250 | MG/L | 0 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 375.4 | TURBIDIMETRIC | 1996 | IOC-1055 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 375.4 | TURBIDIMETRIC | 1996-12-02 |
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 8/19/1999 | 410 | 0.44 | 8/30/1999 | 9908505 | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999-08-19 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/28/1998 | 460 | 0 | 8/3/1998 | 98-8507 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998-07-28 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/21/2000 | 560 | 0.44 | 7/31/2000 | 000744501A | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 2000 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 2000-07-21 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 12/2/1996 | 450 | 0 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1996 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1996-12-02 | |||
AA | WELL | Raw | IOC | 1074 | ANTIMONY, TOTAL | 12/2/1996 | ND | MCL | 0.006 | MG/L | 0.003 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | IOC-1074 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 |
AA | WELL | Raw | IOC | 1075 | BERYLLIUM, TOTAL | 12/2/1996 | ND | MCL | 0.004 | MG/L | 0.0002 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | IOC-1075 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 |
AA | WELL | Raw | IOC | 1085 | THALLIUM, TOTAL | 12/2/1996 | ND | MCL | 0.002 | MG/L | 0.001 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996 | IOC-1085 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1996-12-02 |
AA | WELL | Raw | WQ | 1925 | PH | 8/19/1999 | 7.7 | MCL | 8.5 | PH | 0.1 | 8/30/1999 | 9908505 | 28 | Neilson Research Corporation | 4500HB | 1999 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 1999-08-19 | ||
AA | WELL | Raw | WQ | 1925 | PH | 7/28/1998 | 8.2 | MCL | 8.5 | PH | 0 | 8/3/1998 | 98-8507 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998-07-28 |
AA | WELL | Raw | WQ | 1925 | PH | 7/21/2000 | 8.14 | MCL | 8.5 | PH | 0.1 | 7/31/2000 | 000744501A | 28 | Neilson Research Corporation | 4500HB | 2000 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 2000-07-21 | ||
AA | WELL | Raw | WQ | 1925 | PH | 12/2/1996 | 8 | MCL | 8.5 | PH | 0 | 12/24/1996 | 96-11814 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1996 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1996-12-02 |