Facility ID | Facility Name | Source Type | Analyte Group | Analyte Code | Analyte Name | Sample Date |
Result | Analyte Level Type |
Current Analyte Level |
Analyte Level Units |
Detection Limit |
Received Date |
Sample ID | Lab ID | Lab Name | Analysis Method | Method Name | SelectYear | SelectAnalyte | SelectResult | SelectFacilityID | SelectFacilityName | SelectSourceType | SelectLabID | SelectLabName | SelectMethod | SelectMethodName | FilterSampleDate |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AA | WELL | Raw | NO3 | 1040 | NITRATE | 9/11/1998 | ND | MCL | 10 | MG/L | 0.2 | 9/18/1998 | 9810466 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998-09-11 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/27/2000 | 0.31 | MCL | 10 | MG/L | 0.012 | 8/7/2000 | 000759001B | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2000 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2000-07-27 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 5/23/1999 | ND | MCL | 10 | MG/L | 0.2 | 6/7/1999 | 990546401A | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999-05-23 |
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 9/11/1998 | 80 | 0 | 9/18/1998 | 9810466 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998-09-11 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/27/2000 | 140 | 0.44 | 8/7/2000 | 000759001B | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 2000 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 2000-07-27 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 5/23/1999 | 64 | 0 | 6/7/1999 | 990546401A | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999-05-23 | |||
AA | WELL | Raw | WQ | 1925 | PH | 9/11/1998 | 6.5 | MCL | 8.5 | PH | 0 | 9/18/1998 | 9810466 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998-09-11 |
AA | WELL | Raw | WQ | 1925 | PH | 5/23/1999 | 6.3 | MCL | 8.5 | PH | 0 | 6/7/1999 | 990546401A | 28 | Neilson Research Corporation | 4500HB | 1999 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 1999-05-23 | ||
AA | WELL | Raw | WQ | 1925 | PH | 7/27/2000 | 7.03 | MCL | 8.5 | PH | 0.1 | 8/7/2000 | 000759001B | 28 | Neilson Research Corporation | 4500HB | 2000 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 2000-07-27 |