Facility ID | Facility Name | Source Type | Analyte Group | Analyte Code | Analyte Name | Sample Date |
Result | Analyte Level Type |
Current Analyte Level |
Analyte Level Units |
Detection Limit |
Received Date |
Sample ID | Lab ID | Lab Name | Analysis Method | Method Name | SelectYear | SelectAnalyte | SelectResult | SelectFacilityID | SelectFacilityName | SelectSourceType | SelectLabID | SelectLabName | SelectMethod | SelectMethodName | FilterSampleDate |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/13/1999 | 2.86 | MCL | 10 | MG/L | 0 | 7/21/1999 | 9907240 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999-07-13 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 8/25/1998 | 2.7 | MCL | 10 | MG/L | 0 | 9/4/1998 | 9810034-02 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998-08-25 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 9/23/1997 | 3.2 | MCL | 10 | MG/L | 0 | 9/30/1997 | 97-9802 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1997 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1997-09-23 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 8/28/2001 | 3.45 | MCL | 10 | MG/L | 0.012 | 9/17/2001 | 010861401B | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2001 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2001-08-28 |
A | STANDARD ENTRY POINT | Raw | NO3 | 1040 | NITRATE | 8/30/1994 | 3.17 | MCL | 10 | MG/L | 0 | 9/8/1994 | 94-8745 | 28 | Neilson Research Corporation | 353.3 | CADMIUM REDUCTION, MANUAL | 1994 | NO3-1040 | D | A | STANDARD ENTRY POINT | Raw | 28 | Neilson Research Corporation | 353.3 | CADMIUM REDUCTION, MANUAL | 1994-08-30 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 8/14/1995 | 5.62 | MCL | 10 | MG/L | 0 | 8/21/1995 | 95-8148 | 28 | Neilson Research Corporation | 4500D | 1995 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500D | 1995-08-14 | ||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/13/1999 | 760 | 0 | 7/21/1999 | 9907240 | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999-07-13 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 8/25/1998 | 600 | 0 | 9/4/1998 | 9810034-02 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998-08-25 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 9/23/1997 | 740 | 0 | 9/30/1997 | 97-9802 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1997 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1997-09-23 | |||
AA | WELL | Raw | WQ | 1925 | PH | 7/13/1999 | 7 | MCL | 8.5 | PH | 0 | 7/21/1999 | 9907240 | 28 | Neilson Research Corporation | 4500HB | 1999 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 1999-07-13 | ||
AA | WELL | Raw | WQ | 1925 | PH | 8/25/1998 | 7.2 | MCL | 8.5 | PH | 0 | 9/4/1998 | 9810034-02 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998-08-25 |
AA | WELL | Raw | WQ | 1925 | PH | 9/23/1997 | 7 | MCL | 8.5 | PH | 0 | 9/30/1997 | 97-9802 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1997 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1997-09-23 |